JEOL JSM-6300F SEM Scanning Electron Microscope Column Assembly Untested Surplus

JEOL JSM-6300F SEM Scanning Electron Microscope Column Assembly Untested Surplus Model No: JSM-6300F Column Removed from a JEOL JSM-6300F SEM Scanning Electron Microscope System Untested As-Is This item is untested surplus. The unit has some scuffs to the paint (see photos). The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Sold As-Is for Parts or Repair Estimated Packed Shipping Dimensions: L x W x H = 40"x48"x48" @ 800 lbs; Requires Freight Shipping Shipping Shipping Terms: All Domestic and International shipping quotes and/or fees are subject to change due to packaging requirements, custom packing, transport rate fluctuations, and supply chain demands. We will contact you regarding any shipments that require or incur additional after purchase packing fees or rate changes. Only items pictured are included: If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale. For items with multiple quantities: The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary. Lister 0 RL