JEOL Column Pneumatic Sample Gate JWS-7555S Wafer Defect Review SEM Working

JEOL Column Pneumatic Sample Gate JWS-7555S Wafer Defect Review SEM Working Inventory #  CONF-1329 Part No: Pneumatic Sample Gate Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System This JEOL Column Pneumatic Sample Gate JWS-7555S Wafer Defect Review SEM Working is used working surplus. Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Used Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 14"x14"x14" @ 6 lbs. Only items pictured are included: If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale. For items with multiple quantities: The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary. Items are sold with a 90-Day Satisfaction Guarantee Lister 31