JEOL Column Mechanical Lens Assembly JWS-2000 Wafer Defect Review SEM Working

JEOL Column Mechanical Lens Assembly JWS-2000 Wafer Defect Review SEM Working Inventory # CONF-1320 Part No: Column Mechanical Lens Assembly Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System This JEOL Column Mechanical Lens Assembly JWS-2000 Wafer Defect Review SEM is used working surplus. Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Used Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 16"x16"x16" @ 10 lbs. Only items pictured are included: If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale. For items with multiple quantities: The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary. Items are sold with a 90-Day Satisfaction Guarantee Lister 31