JEOL Inspection Stage Chamber Assembly JWS-2000 Wafer Defect Review SEM Working

JEOL Inspection Stage Chamber Assembly JWS-2000 Wafer Defect Review SEM Working Inventory # CONF-1322 Part No: Inspection Stage Chamber Assembly Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System Installed Components Copal Electronics Part No: PS83-102V Keyence Part No: FS-V31 Koganei Part No: JDAS12x5-74W Omron Part No: E3X-A11 Oriental Motor Part No: PX535MH-B, VEXTA SMC Part No: CDRQB20-01-476 This JEOL Inspection Stage Chamber Assembly JWS-2000 Wafer Defect Review SEM is used working surplus. Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Used Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 24"x24"x24" @ 90 lbs.; Requires Freight Shipping Only items pictured are included: If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale. For items with multiple quantities: The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary. Items are sold with a 90-Day Satisfaction Guarantee Lister 31