JEOL WS-50VB/8 Inspection Stage Chamber JWS-7555S Wafer Defect Review SEM Spare

JEOL WS-50VB/8 Inspection Stage Chamber JWS-7555S Wafer Defect Review SEM Spare* Inventory # CONF-1300 Part No: WS-50VB/8 Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System Installed Components Copal Electronics Part No: PS83-102V 9C3 Koganei Part No: DABL25x55-A-4 Koganei Part No: JDAS12x5-74W Omron Part No: E3X-A11 (Qty. 2) Omron Part No: E3X-NH11 Oriental Motor Part No: PX535MH-B, VEXTA SMC Part No: CDRQB20-01-476 This JEOL WS-50VB/8 Inspection Stage Chamber JWS-7555S Wafer Defect Review SEM Spare is used working surplus. The Omron sensors have broken mounting tabs and one is missing the cover (see photos). The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Used Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 24"x24"x24" @ 90 lbs.; Requires Freight Shipping Only items pictured are included: If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale. For items with multiple quantities: The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary. Items are sold with a 90-Day Satisfaction Guarantee Lister 31