
Nikon 300mm Wafer Inspection Stage Chuck NRM-3100 Overlay Measurement Working
$3,507.25
Shipping: Free FedEx Ground / FedEx Home Delivery®.
Description
Nikon 300mm Wafer Inspection Stage Chuck NRM-3100 Overlay Measurement Working
Model No: Inspection Stage Chuck
Removed from a Nikon NRM-3100 300mm Wafer Overlay Measurement System
This item is working surplus. The physical condition is good, but there are signs of previous use and handling.
Sale Details
Item Condition:
Working, 90 Day Warranty
Estimated Packed Shipping Dimensions:
L x W x H = 24"x24"x24" @ 25 lbs.
Shipping Terms:
All Domestic and International shipping quotes and/or fees are subject to change due to packaging requirements, custom packing, transport rate fluctuations, and supply chain demands. We will contact you regarding any shipments that require or incur additional after purchase packing fees or rate changes.
Only items pictured are included:
If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale.
For items with multiple quantities:
The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary.
Lister 0 RL
Specifications
| Manufacturer | Nikon |
| Model | Inspection Stage Chuck |
| Condition | Used |
| Category | Semiconductor Tools Systems and Components |
| SYSTEM/TOOL | Nikon NRM-3100 300mm Wafer Overlay Measurement System |






