Nikon 300mm Wafer Inspection Stage Chuck NRM-3100 Overlay Measurement Working

$3,507.25
Shipping: Free FedEx Ground / FedEx Home Delivery®.

Description

Nikon 300mm Wafer Inspection Stage Chuck NRM-3100 Overlay Measurement Working Model No: Inspection Stage Chuck Removed from a Nikon NRM-3100 300mm Wafer Overlay Measurement System This item is working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 24"x24"x24" @ 25 lbs. Shipping Terms: All Domestic and International shipping quotes and/or fees are subject to change due to packaging requirements, custom packing, transport rate fluctuations, and supply chain demands. We will contact you regarding any shipments that require or incur additional after purchase packing fees or rate changes. Only items pictured are included: If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale. For items with multiple quantities: The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary. Lister 0 RL

Specifications

ManufacturerNikon
ModelInspection Stage Chuck
ConditionUsed
CategorySemiconductor Tools Systems and Components
SYSTEM/TOOLNikon NRM-3100 300mm Wafer Overlay Measurement System