
JEOL AP002778-00 ARCNET ITF PB PCB Card JWS-2000 Wafer Detect SEM Working Spare
$609.19
Shipping: Free FedEx Ground / FedEx Home Delivery®.
Description
JEOL AP002778-00 ARCNET ITF PB PCB Card JWS-2000 Wafer Detect SEM Working Spare
Inventory # CONF-1266
Part No: AP002778-00
Model No: ARCNET ITF PB
Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System
This JEOL AP002778-00 ARCNET ITF PB PCB Card is used working surplus. The physical condition is good, but there are signs of previous use and handling.
Sale Details
Item Condition:
Used Working, 90 Day Warranty
Estimated Packed Shipping Dimensions:
L x W x H = 14"x14"x14" @ 8 lbs.
Only items pictured are included:
If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale.
For items with multiple quantities:
The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary.
Items are sold with a
90-Day Satisfaction Guarantee
Lister 12
Specifications
| Manufacturer | JEOL |
| Model | ARCNET ITF PB |
| Condition | Used |
| System/Tool | JEOL JWS-2000 Wafer Defect Review SEM |
| Category | Semiconductor Tools Systems and Components |
| Inventory # | CONF-1266 |












